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Electron beam
Results: 1283

#	Item
191	Automatic Particle Selection: Results of A Comparative Study Yuanxin Zhu1, Bridget Carragher1, Robert M. Glaeser2, Denis Fellmann1, Chandrajit Bajaj3, Marshall Bern4, Fabrice Mouche1, Felix de Haas5, Richard J. Hall6, D Add to Reading List Source URL: vision.ucsd.edu Language: English Scientific method Protein structure Electron beam Electron microscopy Transmission electron microscopy Cryo-electron microscopy Defocus aberration Electron Algorithm Physics Microscopes Science
192	p r o d u c t d ata 2 Tecnai™ G F30 The benchmark for high Add to Reading List Source URL: www.emc.missouri.edu Language: English - Date: 2012-07-09 12:57:09 Microscopes Electron beam Transmission electron microscopy Scanning transmission electron microscopy Electron microscope Electron energy loss spectroscopy Scanning electron microscope Scientific method Electron microscopy Science
193	Ethylene Oxide Analysis for Medical Equipment Sterilization Add to Reading List Source URL: www.mksinst.com Language: English - Date: 2010-06-07 14:52:22 Microbiology Sterilization Household chemicals Occupational safety and health ETO Ethylene oxide Gas detector Ethanol Chemistry Hygiene Electron beam
194	RUSSIA MOSCOW CANADA DRESDEN Add to Reading List Source URL: www.vonardenne.biz Language: English Semiconductor device fabrication Coatings Technology Chemical engineering Printing Electron beam physical vapor deposition Evaporation Sputtering Thin film deposition Materials science Chemistry
195	Automatic Particle Selection: Results of A Comparative Study Yuanxin Zhu1, Bridget Carragher1, Robert M. Glaeser2, Denis Fellmann1, Chandrajit Bajaj3, Marshall Bern4, Fabrice Mouche1, Felix de Haas5, Richard J. Hall6, D Add to Reading List Source URL: vision.ucsd.edu Language: English - Date: 2004-01-28 17:58:59 Scientific method Protein structure Electron beam Electron microscopy Transmission electron microscopy Cryo-electron microscopy Defocus aberration Electron Algorithm Physics Microscopes Science
196	EPJ Web of Conferences 9 5, DOI: epjconf 9 C Owned by the authors, published by EDP Sciences, 2015 Overview of results from phase I of the Beam Energy Scan program at RHIC Add to Reading List Source URL: www.epj-conferences.org Language: English Strangeness production Phases of matter Plasma physics Quark–gluon plasma Relativistic Heavy Ion Collider STAR detector QCD matter Relativistic nuclear collisions Electron Physics Particle physics Quark matter
197	FRAUNHOFER-INSTITUT FÜR I nte g rierte S y ste m e un d B aue l e m entete c hno l o g ie I I S B FAILURE ANALYSIS AND Add to Reading List Source URL: www.iisb.fraunhofer.de Language: English - Date: 2015-06-09 04:45:02 Scanning capacitance microscopy Characterization Electron microscope Scanning probe microscopy Failure analysis Transmission electron microscopy Focused ion beam Scanning electron microscope Energy-dispersive X-ray spectroscopy Scientific method Science Electron microscopy
198	PRL 101, week ending 22 AUGUSTPHYSICAL REVIEW LETTERS Add to Reading List Source URL: mrx.pppl.gov Language: English - Date: 2008-08-22 13:32:00 Magnetic reconnection Plasma Electron Electric current Langmuir probe Astrophysical plasma Electron beam ion trap Physics Plasma physics Magnetohydrodynamics
199	RUSSIA MOSCOW CANADA DRESDEN Add to Reading List Source URL: www.vonardenne.biz Language: English Coatings Materials science Manufacturing Plasma processing Physical vapor deposition Thin film Electron beam physical vapor deposition Evaporation Sputtering Thin film deposition Chemistry Semiconductor device fabrication
200	Focused Ion Beam Services Nanostructuring, Failure Analysis, & Rapid IC-Prototyping FhG IISB supports you in processing nanosized structures and helps you to shorten time to market for your ASICs. Focused Ion Beam (FIB) Add to Reading List Source URL: www.iisb.fraunhofer.de Language: English - Date: 2015-06-08 13:41:23 Science Semiconductor device fabrication Thin film deposition Focused ion beam Ion beam Electron microscope Transmission electron microscopy Failure analysis Fib Scientific method Physics Electron microscopy

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